SINGH, K.; 						VENKATESH, V.
 Contamination control study in grown oxide for reliable CMOS operations.
<strong>Journal of Advanced Research in Electronics Engineering and Technology</strong>, [S.l.], v. 7, n. 3&amp;4, p. 6-9, june 2021.
ISSN 2456-1428.
Available at: &lt;<a href="http://thejournalshouse.com/index.php/electronics-engg-technology-adr/article/view/153" target="_new">http://thejournalshouse.com/index.php/electronics-engg-technology-adr/article/view/153</a>&gt;. Date accessed: 02 jan. 2025.