DUBEY, Niranjan.
 Reliability indicators for a parallel system for one or two decimal random data points.
<strong>Journal of Advanced Research in Applied Mathematics and Statistics</strong>, [S.l.], v. 8, n. 1&amp;2, p. 26-38, sep. 2023.
ISSN 2455-7021.
Available at: &lt;<a href="http://thejournalshouse.com/index.php/Journal-Maths-Stats/article/view/856" target="_new">http://thejournalshouse.com/index.php/Journal-Maths-Stats/article/view/856</a>&gt;. Date accessed: 02 jan. 2025.