Reliability indicators for a parallel system for one or two decimal random data points

Niranjan Dubey

Niranjan Dubey Student, Department of Mathematics, Kanhaiyalal Basantlal Post Graduate College – KBPGC, Musaffarganj, Mirzapur

Abstract

The focus of the current work is on analysing component failure laws known as Weibull failure laws when evaluating reliability metrics like reliability and mean time to system failure (MTSF) of a parallel structure. Component failure rates, operation times, form parameters, and the overall number of components employed in the parallel structure have all been observed for one or two decimal random values. The specific case of the Weibull distribution has also been examined in order to examine the variation in reliability and MTSF values.

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