SHUKLA, Vinod N; 						SONI,, Umesh; 						PRAJAPATI, Ramesh Chandra.
 Annealing Effect on Microstructure and Electrical Characteristics  of  n-ZnO/p-Si  Heterojunction Diode Fabricated by RF Sputtering Process.
<strong>Journal of Advanced Research in Electronics Engineering and Technology</strong>, [S.l.], v. 7, n. 1, p. 1-5, june 2021.
ISSN 2456-1428.
Available at: &lt;<a href="http://thejournalshouse.com/index.php/electronics-engg-technology-adr/article/view/141" target="_new">http://thejournalshouse.com/index.php/electronics-engg-technology-adr/article/view/141</a>&gt;. Date accessed: 22 jan. 2025.